International Test Conference 1988 Proceeding@m_New Frontiers in Testing
DOI: 10.1109/test.1988.207827
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New testing equipment for SMT PC boards

L. Balme1,
Anne Mignotte2,
Jean-Yves Monari3
et al.
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ATE and the Testing Process

Wang
1
1991
Digital Circuit Testing
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ATE and the Testing Process

Wang
1
1991
Digital Circuit Testing
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Netlist automatic extractor: "An image processing based software for bare board test data generation"

Benali1,
Balme2,
Vaucher3
Proceedings of IEEE 3rd Asian Test Symposium (ATS)
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The standard mirror boards (SMBs) concept-An innovative improvement of traditional ATE for up to 10 mil bare board testing

Vaucher1,
Balme2
Proceedings of IEEE International Test Conference - (ITC)
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