New type of spectral-domain analysis of a microstrip-line

Abstract

The problem of an open microstrip line is anallzed by the spectral-domain method combined with the sampling theorem. In the spectral domain, the boundary conditions of zero tangential electric fields are expressed in terms of the convolution integral forms with a sampling function, and these relations are discretized by the method of moments with the spherical Bessel function as a weighting function. A well-chosen incorporation of the Weber-Schafheitlin integration formula yields good accuracy and saves a significant amount of time in numerical calculations. Numerical examples are shown for the effective dielectric constants and for the current distributions, both longitudinal and transverse, in comparison with the results obtained by various other methods.

DC Limit of Microstrip Analysis Using the Spectral Domain Approach With Both Transverse and Longitudinal Currents

“…Therefore, the leading term extraction technique is used to reduce the CPU time for the integrals. For each matrix element, the leading term function in (28) is used, and its closed form integral result is listed in (29) [8], [9].…”

“…However, the dc limit of is not zero [2, Appendix B]. Therefore, we define the normalized transverse current as (8) Submitting the Fourier transform of the normalized transverse current and the Green's functions at low frequency limit into (1) leads to (9) while (2) can be expressed in the form of (10) Applying the Galerkin's method, the normalized transverse current and the longitudinal current can be approximated by expansions of the basis functions with unknown coefficients. The Chebyshev polynomials with singularity are used as the basis functions for the longitudinal current and the normalized transverse current [5], [6].…”

“…We can multiply each basis function to (9) and (10), respectively. Then, after performing the integration over from to , and applying Parsval's theorem, we will get linear [7] (15)…”

Microwave and millimeter‐wave device and circuit design based on physical modeling

“…The majority of spectral-domain analyses rely on Galerkin's procedure to determine the unknown coefficients of the expanded current distributions, which causes the numerical results to be sensitive to the choice of the basis functions. New types of spectral-domain analyses have been developed to overcome this difficulty [71]. Recently, reported mixed spectral-domain techniques have been developed which increase the flexibility of the method 1721.…”

Analysis of shielded and open microstrip lines of double negative metamaterials using spectral domain approach (SDA)

“…In [18,19,20], following integral can expressed as the close form. The above identity can be used in the leading extraction for the K matrix element…”