Newly Designed Apparatus for Measuring the Angular Dependent Surface Emittance in a Wide Wavelength Range and at Elevated Temperatures up to 1400°C

Rydzek, M.; Stark, Thomas; Arduini-Schuster, M.; Manara, Jochen

doi:10.1088/1742-6596/395/1/012152

Cited by 9 publications

(6 citation statements)

References 6 publications

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“…

is influenced by additional factors, as explained previously in Ref. [ 23 ]. Referring to the detailed derivation in Ref.…”

Section: Theory and Measurement Proceduresmentioning

confidence: 93%

“…For thin specimens (thickness << diameter), one dimensional heat transfer dominates and Fourier’s law simplifies to [ 23 ]

…”

Section: Methodsmentioning

confidence: 99%

“…Referring to the detailed derivation in Ref. [ 23 ] one obtains the measured intensity

from the detected intensity

by the following equation

…”

Section: Theory and Measurement Proceduresmentioning

confidence: 99%

“…The calibration procedure and the derivation of the calibrating functions

and

from the calibration measurements on a reference blackbody at three different temperatures are described in detail in Ref. [ 23 ]. The resulting relative uncertainty σ at these three temperatures are given in Figure 3 as function of the wavelength.…”

Section: Theory and Measurement Proceduresmentioning

confidence: 99%

“…A setup for determining the spectral directional emissivity at elevated temperatures has also been developed at the Bavarian Center of Applied Energy Research (ZAE Bayern) [ 22 ] and extended previously at ZAE Bayern [ 23 ]. Additionally, another setup is available at ZAE Bayern, namely the integrating sphere (IS) setup, which is an indirect radiometric method [ 24 ].…”

Section: Introductionmentioning

confidence: 99%

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Development and Evaluation of an Improved Apparatus for Measuring the Emissivity at High Temperatures

Arduini

Manara

Stark

et al. 2021

Sensors

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An improved apparatus for measuring the spectral directional emissivity in the wavelength range between 1 µm and 20 µm at temperatures up to 2400 K is presented in this paper. As a heating unit an inductor is used to warm up the specimen, as well as the blackbody reference to the specified temperatures. The heating unit is placed in a double-walled vacuum vessel. A defined temperature, as well as a homogenous temperature distribution of the whole surrounding is ensured by a heat transfer fluid flowing through the gap of the double-walled vessel. Additionally, the surrounding is coated with a high-emitting paint and serves as blackbody-like surrounding to ensure defined boundary conditions. For measuring the spectral directional emissivity at different emission angles, a movable mirror is installed in front of the specimen, which can be adjusted by a rotatable arrangement guiding the emitted radiation into the attached FTIR-spectrometer. The setup of the emissivity measurement apparatus (EMMA) and the measurement procedure are introduced, and the derived measurement results are presented. For evaluating the apparatus, measurements were performed on different materials. The determined emissivities agree well with values published in literature within the derived relative uncertainties below 4% for most wavelengths.

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“…

is influenced by additional factors, as explained previously in Ref. [ 23 ]. Referring to the detailed derivation in Ref.…”

Section: Theory and Measurement Proceduresmentioning

confidence: 93%

“…For thin specimens (thickness << diameter), one dimensional heat transfer dominates and Fourier’s law simplifies to [ 23 ]

…”

Section: Methodsmentioning

confidence: 99%

“…Referring to the detailed derivation in Ref. [ 23 ] one obtains the measured intensity

from the detected intensity

by the following equation