2022
DOI: 10.1002/aelm.202200984
|View full text |Cite
|
Sign up to set email alerts
|

Newly Synthesized High‐k Polymeric Dielectrics with Cyclic Carbonate Functionality for Highly Stability Organic Field‐Effect Transistor Applications

Abstract: Organic field‐effect transistors (OFETs) with low‐voltage‐operating high‐stability are regarded as one of the key components of future electronics. However, it remains a challenge to enhance bias–stress stability, mechanical durability and environmental adaptability while reducing the operating voltage of the flexible OFETs. In this study, a new strategy of introducing high‐dipole‐moment groups into polymer side chains to enhance the intensity of polarization was proposed. This strategy can redirect cyclic car… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
9
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
8

Relationship

3
5

Authors

Journals

citations
Cited by 15 publications
(9 citation statements)
references
References 55 publications
0
9
0
Order By: Relevance
“…Generally, the smooth surface morphology is highly desirable for gate dielectric application in transistors and therefore results in high‐quality semiconductor/dielectric interfacial properties. [ 38–40 ] As illustrated by the AFM measurement in Figure 1c(i,ii), the root mean square (RMS) roughness of the PVK film (1.36 nm) is about half of that of P(VDF‐TrFE‐CFE) film (2.61 nm). This finding indicates the PVK layer not only plays the role of an insulator but induces a certain passivation of the device.…”
Section: Resultsmentioning
confidence: 99%
“…Generally, the smooth surface morphology is highly desirable for gate dielectric application in transistors and therefore results in high‐quality semiconductor/dielectric interfacial properties. [ 38–40 ] As illustrated by the AFM measurement in Figure 1c(i,ii), the root mean square (RMS) roughness of the PVK film (1.36 nm) is about half of that of P(VDF‐TrFE‐CFE) film (2.61 nm). This finding indicates the PVK layer not only plays the role of an insulator but induces a certain passivation of the device.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, the pentacene organic semiconductor active layer was evaporated via the thermal evaporation deposition. Such core systems lower the degree of fracture or delamination in the repeated bending process while slightly affect the appearance of the memory device, showing the development prospect of the device in the flexible wearable field [54].…”
Section: Durability Of Flexible F-ofet-nvm Devices Under Mechanical B...mentioning
confidence: 98%
“…At a provided electric field of 150 V μm −1 , a pure P(VDF-TrFE-CTFE) film has a remanent polarization (P r ) score of roughly 4.5 mC m −2 , and in figure S3, the P r marginally rose from 4.9 to 5.7 mC m −2 as the thickness of the AlO X layers extended from 1 to 3 nm. The former demonstrates that there is little association between the considerable improvement in Fe-OFETs performance brought about by utilizing an AlO X layer and the crystalline nature of organic semiconductors [32,33]. According to the latter, the ultrathin AlO X layer prevents the suppression of the polarization fluctuation caused by the orientation difference of dipole moments among ferroelectric microcrystals, which consequently increases the mobility of the transistor (see figure S6) [22].…”
Section: Structure and Electrical Characterizations Of Fe-ofetmentioning
confidence: 99%