Pt-, Pd-, and Zr-doped SnO 2 thin films and dopant-free VO x films were fabricated by planar magnetron sputtering. Tests for sensitivity to SO 2 for all samples were conducted at 180°C, and the sensitivities were investigated ex situ with photometric and ellipsometric methods at room temperature. It was found that the optical sensitivities as well as the sensitive wavelength region for SnO 2 films could be tuned by doping. The Pd-doped SnO 2 films had good sensitivity in the visible range, and the Zr-doped in the near IR. The dominant sensitive wavelength region for VO x films fell into the visible range, and the ratio of the sensitivity in the visible to that in the near IR increased with O 2 /Ar in the depositing atmosphere.