2004
DOI: 10.1016/j.mseb.2004.07.076
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Nickel silicides in semiconductor processing: thermal budget considerations

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Cited by 5 publications
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“…Ni is widely used for forming silicide due to its ease of availability and lower cost. Moreover, nickel silicide (NiSi) can be formed at temperatures starting from 250 1C to higher temperatures of 500 1C as reported [13][14][15][16]. Contact resistivity as low as 0.01 mO cm 2 is reported for metal-semiconductor contacts formed using NiSi [17].…”
Section: Introductionmentioning
confidence: 87%
“…Ni is widely used for forming silicide due to its ease of availability and lower cost. Moreover, nickel silicide (NiSi) can be formed at temperatures starting from 250 1C to higher temperatures of 500 1C as reported [13][14][15][16]. Contact resistivity as low as 0.01 mO cm 2 is reported for metal-semiconductor contacts formed using NiSi [17].…”
Section: Introductionmentioning
confidence: 87%