2000
DOI: 10.1063/1.1309021
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Nitrogen dependence of the GaAsN interband critical points E1 and E1+Δ1 determined by spectroscopic ellipsometry

Abstract: The effects of the nitrogen concentrations on the E1 and E1+Δ1 transitions of tensile-strained GaAs1−yNy (0.1%⩽y⩽3.7%) grown pseudomorphically to GaAs by metalorganic vapor-phase epitaxy are studied by spectroscopic ellipsometry. Adachi’s critical-point composite model is employed for ellipsometry data analysis. Contrary to the well-known redshift of the band-gap energy E0, we observe linearly blueshifted E1 and E1+Δ1 transition energies with increasing nitrogen composition y. For nitrogen compositions of 0⩽y⩽… Show more

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Cited by 43 publications
(22 citation statements)
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“…5,6 SE could be particularly valuable for retrieving information on the CPs in dilute nitrides where the oscillator strengths of the N-induced transitions are relatively small ͑especially for low-N content samples as in our case͒ and there is N-induced broadening. [7][8][9] Figure 1 shows experimental ͑scatters͒ and best-fit calculated ͑solid lines͒ data in the GaAs 0.9−x N x Sb 0.1 pseudodielectric function representation for the different nitrogen compositions. We determine the dielectric function of GaAs 0.9−x N x Sb 0.1 from the experimental ellipsometric data analysis using a five-layer model: GaAs substrate/ GaAs 0.9−x N x Sb 0.1 layer/GaAs caplayer/GaAs native oxide/ ambient.…”
mentioning
confidence: 99%
“…5,6 SE could be particularly valuable for retrieving information on the CPs in dilute nitrides where the oscillator strengths of the N-induced transitions are relatively small ͑especially for low-N content samples as in our case͒ and there is N-induced broadening. [7][8][9] Figure 1 shows experimental ͑scatters͒ and best-fit calculated ͑solid lines͒ data in the GaAs 0.9−x N x Sb 0.1 pseudodielectric function representation for the different nitrogen compositions. We determine the dielectric function of GaAs 0.9−x N x Sb 0.1 from the experimental ellipsometric data analysis using a five-layer model: GaAs substrate/ GaAs 0.9−x N x Sb 0.1 layer/GaAs caplayer/GaAs native oxide/ ambient.…”
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confidence: 99%
“…We also observe a blueshift of the E 1 transition from about (3.675 AE 0.002) eV to (3.709 AE 0.006) eV for GaP 0.977 N 0.023 . This blueshift, which is due to the dominating influence of alloying (E 1 b-GaN % 7 eV), was also observed for GaAsN alloys using SE [9]. The CP's E 1 , E 0 1 , and E 0 0 , are due to transitions along the D direction and at the G-point of the first Brillouin zone (BZ), respectively [11,12].…”
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confidence: 86%
“…They observed a two-mode phonon behaviour, i.e., the GaP-like (w LO1 % 401-399 cm --1 ) and the GaN-like (w LO2 % 495-503 cm --1 ) longitudinal optical phonons. Recently, spectroscopic ellipsometry (SE) was used as novel technique for precise determination of phonon modes and critical points in GaN y As 1--y [8,9]. SE for mid-infrared (mir) and near-infrared (nir) to vacuum-ultraviolet (vuv) wavelengths are used in this study to investigate phonon modes and critical points of GaP 0.977 N 0.023 , respectively.…”
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confidence: 99%
“…In this figure, we observed that the E 1 and E 1 +D 1 transitions in the GaAsN alloys shift to high energies with increasing nitrogen content in the samples. This shift is originated by the combined effects of strain and alloying in the films [10]. The strain produces a red shift that can be estimated for E 1 by…”
Section: Article In Pressmentioning
confidence: 99%