2013
DOI: 10.1109/tim.2012.2230733
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Noise and Correlation Study of Quantum Hall Devices

Abstract: We report voltage noise measurements on the cryogenic quantum Hall resistance (QHR) and present two new findings to illustrate the potential of the two-channel instrumentation used. Without applied current, only Johnson-Nyquist noise is present, but at two separate pairs of quantum Hall terminals, it can be cross-correlated via a longitudinal resistance. With applied current, excess noise due to dissipation bursts appears, which increases dramatically with the noninteger fraction of the filling factor.

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Cited by 6 publications
(6 citation statements)
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“…The current fluctuations caused by the device were obtained by measuring the noise of the voltage drop across a 12.9 k shunt resistor, which was connected to the drain contact of the device and the outer conductor and was cooled to 4 K in a liquid helium storage Dewar. The measured voltage fluctuations were amplified by a low-noise preamplifier [35] (equivalent root mean square input noise voltage: 0.5 nV/ÝHz) and recorded by an analog-to-digital converter model PXI-4461 from National Instruments [36] at a scan rate of 20 000 Hz. Each trace of voltage fluctuations was recorded for 2 sec and subsequently Fourier transformed to obtain a spectrum in the frequency range of 20 to 5000 Hz.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The current fluctuations caused by the device were obtained by measuring the noise of the voltage drop across a 12.9 k shunt resistor, which was connected to the drain contact of the device and the outer conductor and was cooled to 4 K in a liquid helium storage Dewar. The measured voltage fluctuations were amplified by a low-noise preamplifier [35] (equivalent root mean square input noise voltage: 0.5 nV/ÝHz) and recorded by an analog-to-digital converter model PXI-4461 from National Instruments [36] at a scan rate of 20 000 Hz. Each trace of voltage fluctuations was recorded for 2 sec and subsequently Fourier transformed to obtain a spectrum in the frequency range of 20 to 5000 Hz.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Most experiments on QHEBD have been carried out using conventional conductance or resistance measurements in which the time-averaged data are investigated [4,[9][10][11][12][13][14][15][16][17][18]. On the other hand, recently, considerable interest has focused on current noise measurements, which allow electron conduction in the QHEBD state to be investigated in more detail [7,[19][20][21]. Current noise is the fluctuation of the current around its average value over a finite time, which is quantified using the power spectral density, S I .…”
Section: Introductionmentioning
confidence: 99%
“…This is also confirmed by the noise power spectra which are not white but show a 1/f characteristic. The time series look like a random signal, without any indication of burst noise or bi-stable noise as observed at GaAs devices [9]. The excess noise might be related to the onset of the breakdown and it seems to occur mainly in imperfect devices.…”
Section: Spectral Noise Powermentioning
confidence: 80%
“…While a low noise figure is essential to precision QHR measurements, this topic has not been studied very much so far. Therefore, we measured the excess noise of a graphene device in a coaxial resistance ratio bridge by means of a lock-in amplifier [14] as well as directly by a digital data acquisition system as described in [9]. Fig.…”
Section: Spectral Noise Powermentioning
confidence: 99%
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