1985
DOI: 10.1103/physrevlett.55.296
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Noise scaling in continuum percolating films

Abstract: Measurements of the scaling of \/f noise magnitude versus resistance were made in metal films as the metal was removed by sandblasting. This procedure gives an approximate experimental realization of a Swiss-cheese continuum-percolation model, for which theory indicates some scaling properties very different from lattice percolation. The ratio of the resistance and noise exponents was in strong disagreement with lattice-percolation predictions and agreed approximately with simple continuum predictions. PACS nu… Show more

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Cited by 73 publications
(29 citation statements)
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“…Recent simulations of a 2D random resistance network yields w = 2.6 [34]. Such a scaling has been found in experiments on classical percolating 2D systems, with w = 3.4 − 4.2 for sand blasted metal films [35], and w = 2.0 ± 0.1 for thin gold films [36]. We now consider the nature of the MIT we observe at p s = p c in light of our results on the noise.…”
supporting
confidence: 68%
“…Recent simulations of a 2D random resistance network yields w = 2.6 [34]. Such a scaling has been found in experiments on classical percolating 2D systems, with w = 3.4 − 4.2 for sand blasted metal films [35], and w = 2.0 ± 0.1 for thin gold films [36]. We now consider the nature of the MIT we observe at p s = p c in light of our results on the noise.…”
supporting
confidence: 68%
“…19,24,25 Thus, the large exponent of our empirical relation (10) is consistent with several previous works. 2629 …”
Section: Resultsmentioning
confidence: 99%
“…On the other hand, similar values of t may be explained by assuming other conduction mechanisms as, for instance, interparticle tunneling 26 or whenever a distribution of conductance exists. 27 As the local values of the resistor and capacitor are related to the geometrical arrangement, it is worth investigating the evolution of the average value of these quantities while V f increase and to compare it with the evolution of their macroscopic counterparts. Below the percolation threshold, no continuous path of resistor may be found in the RC network but the rise of the correlation length corresponding to the rise in the number of contact between fillers leads to an increase of the relative permittivity.…”
Section: Results For Random 3-d Microstructuresmentioning
confidence: 99%