Non-contact scanning nonlinear dielectric microscopy

Ohara, Koya; Cho, Yasuo

doi:10.1088/0957-4484/16/3/010

Cited by 44 publications

(32 citation statements)

References 8 publications

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“…In addition, the amplitude of the second harmonic e 4 ðAÞ can be used for feedback to achieve noncontact operation because e 4 is independent of the direction of the dipole moment. 1,8 Thus, NC-SNDM can simultaneously acquire topography from e 4 and the polarization distribution from e 3 . The present measurement sensitivity is of the order of 10 À22 F= ffiffiffiffiffiffi Hz p .…”

Section: Noncontact Scanning Nonlinear Dielectric Microscopymentioning

confidence: 99%

“…7 Non-contact SNDM (NC-SNDM) has been developed based on higher-order nonlinear dielectric measurements and it permits nondestructive and simultaneous imaging of the topography and dipole moments with an atomic resolution. 8 The 2nd order nonlinear dielectric constant e 3 measured at each lateral position of the tip is closely related to the local dipole moments of a sample surface, since the 2nd order nonlinearity depends on an asymmetric response of local electric displacement to the external electric field. Although, in general, e 3 is not necessarily simply proportional to the dipole moments, the e 3 ðA cos hÞ images constructed by the magnitude A and phase h of e 3 reflect the spatial distribution of dipole moments.…”

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confidence: 99%

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Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

Yamasue

Cho

2013

Journal of Applied Physics

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Non-contact scanning nonlinear dielectric microscopy (NC-SNDM) can resolve the topography and dipole moment distribution of a Si(111)-(7 × 7) surface on an atomic level. We discuss the origin of the atomic contrast in dipole moment images based on simultaneously acquired time-averaged tunneling current images. The dipole moment images are found to have the same characteristics as the simultaneously acquired current images. This similarity between these two images does not originate from circuit crosstalk since it is suppressed by our circuit design that decouples the tip-sample capacitance and the tunneling current. Constant-height images also indicate that the atomic contrast is not artificially caused by feedback crosstalk. These results suggest that the atomic contrast is due to the variation in the tip-sample capacitance caused by modulation of atomic dipole moments by the local density of states of the surface.

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Section: Noncontact Scanning Nonlinear Dielectric Microscopymentioning

confidence: 99%

mentioning

confidence: 99%

Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

Yamasue

Cho

2013

Journal of Applied Physics

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“…Therefore, probe and/or medium abrasion is a serious problem, and the establishment of a noncontact probe height control technique is highly desirable for practical application. On the other hand, if we consider the proposed probe data storage, then a higher-order nonlinear dielectric constant detection method, which was developed in the field of microscopy technology, can be utilized for noncontact probe height control [5], [6]. This method can yield outstanding results, such as the realization of atomicscale resolution imaging [7].…”

Section: Noncontact Probe Height Controlmentioning

confidence: 99%

Novel HDD-type SNDM ferroelectric data storage system aimed at high-speed data transfer with single probe operation

Hiranaga¹,

Uda²,

Kurihashi³

et al. 2007

IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

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In this study, several read/write tests were conducted using a novel ferroelectric data storage test system equipped with a spindle motor, targeted at high-speed data transfer using a single probe head. A periodically inverted signal can be read out correctly with a bit rate of 100 kbps using this test system, and 10 Mbps data transfer is also possible during writing operations. The effect of a dc-offset voltage applied to the writing waveform with high-speed probe scanning is discussed. In addition, a novel noncontact probe height control technique was adopted to solve the problem of tip abrasion.

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“…Although the stripe pitch was large surface of ferroelectrics, so these experimental results are compared by the size of actual data bits, this experiments available for the contacting mode. On the other hand, made sense sufficiently as a feasibility demonstration non-contact mode is achieved by detecting the higher-concering reading speed, because the intensity of read order nonlinear dielectric responses [5][6][7]. The detail of signal was not dependent on the domain size unless the the operation mechanism is mentioned later.…”

Section: Introductionmentioning

confidence: 99%

“…Considering our probe 2 ' data storage, higher-order nonlinear dielectric constant 200ns detection method, which was developed in the field of microscopy technology, can be utilized as a non-contact Fig. 4 SndM iae of te data bis w n on probe-height control [5,6]. This method brings about LiTaO3 underthe bitrate of(a) Mbps and (b) outstanding results, for example, realization of atomicscale resolution imaging [7].…”

Section: Introductionmentioning

confidence: 99%

Non-Contact Probe Control and High-Speed Writing for Rotated-Disk-Type Ferroelectric Data Storage Devices

Hiranaga¹,

Uda²,

Kurihashi³

et al. 2007

2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics

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In this study, several read/write tests were speed domain switching in ferroelectrics. The capability conducted using novel type of ferroelectric data storage of high-speed data writing was demonstrated using this system, which was equipped with spindle motor, under system. the conditions relatively close to the actual operations.Additionally, the novel technique of probe-height Firstly, high-speed data transfer was demonstrated control was developed by using the R/W head based on regarding both reading and writing. Subsequently, the scanning nonlinear dielectric microscopy (SNDM) novel non-contact probe-height control technique was technique, which realized R/W with keeping the probe discussed.from coming in contact with the recording medium. It is expected that this technique give a solution to the INTRODUCTION problem of probe abrasion and contribute to realization of the highly reliable probe storage devices. Various data storage methods based on scanning probe microscopy techniques have been proposed to date ROTATED-DISK-TYPE FERROELECTRIC DATA [1,2]. Multi-probe-type read/write (R/W) heads have STORAGE SYSTEM been employed in most of these probe data storage, because R/W speed per probe are low. However, the A novel type of a ferroelectric data storage system applicability of the multi-probe technology is limited, based on SNDM has been developed in order to conduct because there is a restriction that the size of R/W circuit fast R/W tests under several conditions. The outstanding per probe must be reduced enough to be integrated on feature of this system is that high-accuracy spindle motor small packages.is introduced into a positioning section in place of piezo On the other hand, the past studies on ferroelectric scanners, which were used in conventional probe storage domain formation in nanoscale area have revealed that systems. Figure 1 shows the schematic diagram of this ferroelectrics, especially LiTaO3 single crystal, have a system. The rotation speed of the spindle motor can be great deal of potential for mass-storage device controlled in the range of 40 to 20000 rpm. applications [3,4]. It is noteworthy that domain switching A conventional SNDM circuit is used as an R/W head. time is less than 1 ns for ultra-thin (<20 nm) ferroelectric That is, the head is composed of a sharp-pointed recording media [4]. Thus rotated-disk-type data storage conductive probe and an oscillator. When reading data system was developed in order to take advantage of high-written on a ferroelectric recording medium, polarization

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Non-contact scanning nonlinear dielectric microscopy

Cited by 44 publications

References 8 publications

Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

Novel HDD-type SNDM ferroelectric data storage system aimed at high-speed data transfer with single probe operation

Non-Contact Probe Control and High-Speed Writing for Rotated-Disk-Type Ferroelectric Data Storage Devices

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