Non-Destructive Failure Analysis of Power Devices via Time- Domain Reflectometry

Sharma, Kanuj; Kamm, Simon; Afanasenko, Valentyna; Barón, Kevin Muñoz; Kallfass, Ingmar

doi:10.1109/case49439.2021.9551614

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Cited by 4 publications

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“…Due to the complexity of the PM structure, interpretation of the measurement results is highly intricate. To circumvent this, SoH estimation from the S-parameters could be performed by an artificial intelligence, trained using simulation and field tests [11].…”

Section: Discussionmentioning

confidence: 99%

“…RF measurements technics are routinely used to assess the quality of cables, packages, PCB, and interconnects [10], [11], or to estimate parasitic elements [12]. Using Spread-Spectrum Time Domain Reflectometry (SSTDR), Furse, Kahn, et al [13] have been able to monitor the degradation of power electronics components and systems, including a discrete switching cell processing a low power.…”

Section: Introductionmentioning

confidence: 99%

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