Non-equilibrium statistical theory for electromigration damage

Montemayor-Aldrete, J.A.; Vázquez-Villanueva, C.; Ugalde-Vélez, P.; Castillo-Mussot, Marcelo del; Vazquez-Fonseca, Gerardo; Mendoza-Allende, A.; Coyotécatl, H.A.

doi:10.1016/j.physa.2008.06.045

Cited by 3 publications

(3 citation statements)

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“…For normal home utilities, current densities are approximately 10 2 A cm À2 and do not result in aging or electromigration. 27 In the case of our resistor experiments, current densities reach a maximum of about 500 A cm À2 (1 A in an estimated section of 2 Â 10 À3 cm 2 ), which would be low for a metal. However, in this case, we have a resistor, where electrical scattering is larger than that in metals.…”

Section: B Degradationmentioning

confidence: 62%

“…26 The use of a damage parameter, D, has also been inferred from statistical principles. 21,27 However, this relationship is not considered useful to explain our results because I can either increase or decrease, which is not explained with this equation. In electrical degradation, two possible mechanisms are found: cascade conduction and resistance increase.…”

Section: A Damage Characterizationmentioning

confidence: 95%

“…In our opinion, this was not evident in previous studies based on D parameters. 5,6,13,27 Thus, we plot the curve of added power to the resistor as a function of temperature, P(T), as illustrated in Fig. 12, which shows linear behavior, and we can estimate _ S i from the linear fit.…”

Section: A Damage Characterizationmentioning

confidence: 99%

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Irreversible entropy model for damage diagnosis in resistors

Cuadras

Crisóstomo

Ovejas

et al. 2015

Journal of Applied Physics

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Entropy and irreversibility in the quantum realm Am. J. Phys. 79, 297 (2011) We propose a method to characterize electrical resistor damage based on entropy measurements. Irreversible entropy and the rate at which it is generated are more convenient parameters than resistance for describing damage because they are essentially positive in virtue of the second law of thermodynamics, whereas resistance may increase or decrease depending on the degradation mechanism. Commercial resistors were tested in order to characterize the damage induced by power surges. Resistors were biased with constant and pulsed voltage signals, leading to power dissipation in the range of 4-8 W, which is well above the 0.25 W nominal power to initiate failure. Entropy was inferred from the added power and temperature evolution. A model is proposed to understand the relationship among resistance, entropy, and damage. The power surge dissipates into heat (Joule effect) and damages the resistor. The results show a correlation between entropy generation rate and resistor failure. We conclude that damage can be conveniently assessed from irreversible entropy generation. Our results for resistors can be easily extrapolated to other systems or machines that can be modeled based on their resistance. V C 2015 AIP Publishing LLC.

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Section: B Degradationmentioning

confidence: 62%