2015
DOI: 10.1039/c5tc01763g
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Non-laminated growth of chlorine-doped zinc oxide films by atomic layer deposition at low temperatures

Abstract: ARTICLE This journal isChlorine doping in a ZnO matrix to a concentration of 0.65±0.05 at.% was accomplished via atomic layer deposition using a home-made chlorine source at a low deposition temperature of 140 o C. Structural and morphological properties were investigated using X-ray diffraction, field emission scanning electron microscopy, and grazing incidence wide-angle X-ray diffraction. The introduction of chlorine into the ZnO matrix resulted in significant grain growth reorientation due to chlorine dopi… Show more

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Cited by 22 publications
(18 citation statements)
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“…After surface modification with halide ions, halide dopants preferably filled the O related defects (such as oxygen vacancy or substitution of O 2− lattice ions) in the ZnO matrix which results of a reduction of O related surface defects. As the green emission is mainly contributed by deep level defect states, therefore a significant quenching of the visible emission is likely to happen when the halides are attached to the defect states . We found upon attachment of halide ions the defect state emission has been quenched significantly which is shown in Figure a.…”
Section: Resultsmentioning
confidence: 66%
“…After surface modification with halide ions, halide dopants preferably filled the O related defects (such as oxygen vacancy or substitution of O 2− lattice ions) in the ZnO matrix which results of a reduction of O related surface defects. As the green emission is mainly contributed by deep level defect states, therefore a significant quenching of the visible emission is likely to happen when the halides are attached to the defect states . We found upon attachment of halide ions the defect state emission has been quenched significantly which is shown in Figure a.…”
Section: Resultsmentioning
confidence: 66%
“…Another peak in PL spectra shown in the region between 450 nm and 700 nm is giving information about surface defect such as oxygen vacancy and/or point defects of ZnO thin film [22,25,26,30,31]. It is already well known that surface oxygen vacancy of metal oxide film is quite important for the high electrical conductivity of the film.…”
Section: Resultsmentioning
confidence: 99%
“…Another optical characteristic like photoluminescence (PL) spectroscopy has been widely used to determine the optical band structure, and also PL spectra in the high wavelength represents the status of the surface structure kinds of surface defects of ZnO thin film [22,25,26,30,31]. In conventional PL spectra of ZnO thin film, one can detect two major peaks, one is strong emission peaks in the UV region of 380 nm 400 nm which is related to the property of optical band gap.…”
Section: Resultsmentioning
confidence: 99%
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