2017
DOI: 10.1016/j.ymssp.2016.09.030
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Nondestructive diagnosis of flip chips based on vibration analysis using PCA-RBF

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Cited by 40 publications
(13 citation statements)
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“…It can be used to reduce the data dimensionality and eliminate some irregularities from the data. e reduction process is as follows [15].…”
Section: Pcamentioning
confidence: 99%
“…It can be used to reduce the data dimensionality and eliminate some irregularities from the data. e reduction process is as follows [15].…”
Section: Pcamentioning
confidence: 99%
“…Design flaws and defects need to be eliminated to deliver cutting-edge products with long lifetime. [1] Nondestructive methods to inspect and detect functional faults range mainly from x-ray tomography [2] to scanning acoustic microscopy, [3] surface acoustic waves, [4,5] and thermography. [6] Additionally, transient thermal analysis can be applied to detect crack propagation in solder joints.…”
Section: Introductionmentioning
confidence: 99%
“…For ensuring the high reliability of internal connection, effective methods for non-destructively detecting the defects of flip chip are needed. A variety of techniques including X-ray microscopy [6], laser ultrasound [7], active infrared thermal imaging [8], vibration analysis [9], and AMI (acoustic micro imaging) [10][11][12] have been proven to be available for detecting the defects of interconnections in flip chip. X-ray detection technology has been widely used in non-destructive detection of defects; however, this method requires expensive equipment, generates harmful radiation to the human body, and needs experienced operators.…”
Section: Introductionmentioning
confidence: 99%