2017
DOI: 10.1109/jphotov.2017.2688022
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Nondestructive Probing of Perovskite Silicon Tandem Solar Cells Using Multiwavelength Photoluminescence Mapping

Abstract: L subcells integrated into a monolithic tandem solar cell is challenging though crucial in order to identify performance limiting loss mechanisms. This method can be used to improve the study of the mutual influence of adjacent subcells in the fully fabricated device, which has been an unfeasible task up to now.

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Cited by 25 publications
(16 citation statements)
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“…First, we explain the underlying physics of our imaging concept. Highly efficient metal halide PSCs have been reported to yield relatively symmetrical band‐to‐band luminescence spectra at room temperature without any sub‐bandgap signal . In order to verify this, we capture luminescence spectra from various perovskite films with different compositions and plot them in Figure 1 .…”
Section: Methods Descriptionmentioning
confidence: 93%
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“…First, we explain the underlying physics of our imaging concept. Highly efficient metal halide PSCs have been reported to yield relatively symmetrical band‐to‐band luminescence spectra at room temperature without any sub‐bandgap signal . In order to verify this, we capture luminescence spectra from various perovskite films with different compositions and plot them in Figure 1 .…”
Section: Methods Descriptionmentioning
confidence: 93%
“…Recently, luminescence imaging has increased in significance for perovskite device and material characterization. Many works have extracted various device parameters of PSCs such as correlations between luminescence intensities and open‐circuit voltages, spatial distributions of nonradiative recombination centers, series resistances from EL images, and lateral inhomogeneities on each subcell in monolithic perovskite‐silicon tandem structures . It is also a powerful tool for monitoring long‐term performance and stability of PSCs .…”
Section: Introductionmentioning
confidence: 99%
“…The material quality can be further analyzed by multiwavelength photoluminescence (PL) mapping . PL can show electronic defects in semiconductor materials.…”
Section: Performance Optimizationmentioning
confidence: 99%
“…Steady‐state luminescence intensity, on the other hand, can be readily captured in an imaging configuration with resolutions from micrometers to millimeters, resolving the full cell area in less than a second. To date, a handful of studies have used luminescence imaging of PSCs to reveal the relative distribution of nonradiative recombination, the resistance to charge carrier injection and extraction (i.e., series resistance) and perovskite‐silicon tandem structures . Yet one of the major advantages of the generalized Planck law of Equation is the ability to translate luminescence intensity to quantitative device parameters through the fundamental relationship between luminescence and electrochemical potential.…”
Section: Introductionmentioning
confidence: 99%