Nonlinear absorption in high-reflector multilayers

Stolz, Christopher J.; Sarginson, Timothy G.; Taylor, John R.

doi:10.1117/12.180887

Cited by 1 publication

(1 citation statement)

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“…Since a footprint is observed, the absorptance change lasts about 24 hours, the required time to make these measurements. However, the initial absorptance may return in time periods of a few months, as reported by reference [13]. The results also show that a PTD technique has sufficient stability to measure absorptances in a scan mode.…”

Section: Discussionsupporting

confidence: 49%

<title>High reflector absorptance measurements by the surface thermal lensing technique</title>

Chow

Taylor

et al. 1997

SPIE Proceedings

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November 4, 1996This is a preprint of a paper intended for publication in a journal or proceedings. Since changes may be made before publication, this preprint is made available with the understanding that it will not be cited or reproduced without the permission of the author. PREPRINTThis paper was prepared for submittal to the DISCLAIMER This document was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor the University of California nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or the University of California. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or the University of California, and shall not be used for advertising or product endorsement purposes. ABSTRACTSurface thermal lensing is an alternate configuration of a photothermal deflection system that was used to measure low levels of optical absorption. The thermal lensing configuration facilitated the alignment of the pump and probe laser beams by using a larger diameter probe beam. This technique was applied to high performance optical coatings, specifically high reflectors at 511 nm, zero degrees angle of incidence. The absorptance of these coatings was previously measured using a high power copper vapor laser system. A high power copper laser beam is focused onto a ~2 mm diameter spot. A thermal camera senses the temperature rise with respect to the rest of the coating. The temperature change, power density and beam diameter were used with an empirical formula that yields optical absorption. The surface thermal lensing technique was able to resolve absorption levels lower than that achieved with the copper laser method.

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Section: Discussionsupporting

confidence: 49%