The evolution of mechanical properties and failure mechanisms in leadless solder interconnects, specifically 98.5Sn1.0Ag0.5Cu (SAC105), are continually influenced by isothermal aging and thermal loading over time. Accurate prediction of electronic assembly reliability necessitates the integration of these aging effects within the finite element analysis framework for solder thermal fatigue. This paper endeavors to elucidate the effects of pre-isothermal aging on the mechanical behavior of SAC105 interconnects under thermal cycling. Utilizing the finite element method coupled with material constitutive parameters from existing literature, the investigation examines two pivotal constitutive models-Anand and Garofalo. Creep behavior, characterized by Anand and Garofalo constants, is assimilated into the models to evaluate the aged SAC105's mechanical response during thermal cycling. Findings indicate that isothermal aging significantly alters the thermomechanical performance of SAC105 solder, particularly after brief aging periods, with diminishing impact over extended durations. Numerical analysis confirms the predominance of secondary creep in the mechanical response of SAC105, as opposed to isotropic hardening or viscoplasticity. Additionally, this study provides a comprehensive assessment of thermal fatigue in pre-aged solders, employing both strain-based and energy-based fatigue models. The insights reveal a reduced lifespan for aged solders compared to their unaged counterparts, with extended aging correlating with exacerbated thermal fatigue degradation. These outcomes furnish critical understanding for enhancing the reliability predictions of solder interconnects in electronic assemblies, post-isothermal aging.