Nonlinear Near Field Optics

Vigoureux, Jean-Marie; Girard, Christian; Depasse, Françoise

doi:10.1080/09500349414550071

Cited by 22 publications

(17 citation statements)

References 18 publications

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“…Using a tip of 7.5 nm radius, one usually obtains a lateral extension c 20 nm for this field intensity. In any case, this simulation strikingly illustrates the optical confinement originating from the interface geometry (Vigoureux et al 1994).…”

Section: Field Distribution In the Tip-sample Junctionmentioning

confidence: 87%

Theoretical analysis of scanning near‐field optical microscopy

Girard

1994

Scanning

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Summary:The near-field optical (NFO) interaction between a pointed detector and dielectric or metallic substrates can be exploited to perform both nanometer scale topographies or spectroscopies of surfaces in the real space. The correlation of optical signals recorded with such detectors with other properties of the object (shape, index variation, ...) provides a wealth of new opportunities for characterization of small objects which has not yet been completely assessed. In fact, this new field represents a challenge to theoretical optics since NFO effects often are beyond the scope of classical theories. We present in this contribution a detailed study of both tip-sample interactions and optical energy transfer occurring in scanning near-field optical microscopy (SNOM). The treatment is based on the field-susceptibility method applied in the real space. In this description, all multiple interactions including reflections with a substrate of arbitrary profile are accounted for by the usual self-consistent equations. An original numerical scheme, based on a discretization procedure in the real space, is used to compute the field inside SNOM devices. This contribution reports the results of the numerical applications of this method to various NFO effects including, image-object relation, nearfield spectroscopy of metallic aggregates, light-induced forces, and nonlinear effects in confined geometry.

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Section: Field Distribution In the Tip-sample Junctionmentioning

confidence: 87%

Theoretical analysis of scanning near‐field optical microscopy

Girard

1994

Scanning

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“…We note that the method we develop for calculating the scattering of light from a small nonlinear inhomogeneity may be of independent interest. In particular, it is readily extended to collections of small inhomogeneities, which is a physical setting that arises in applications to biomedical imaging and nonlinear microscopy [19][20][21][22][23][24][25]. We plan to report the results of such calculations elsewhere.…”

Section: Second-and Third-order Nonlinearitiesmentioning

confidence: 99%

“…A refinement of apertureless NSOM is to introduce a fluorescent tip, which allows for the spectral isolation of the detected light and improvement in SNR by background sup- pression [18]. Spectral isolation may also be achieved by utilizing a tip that has a nonlinear optical response [19][20][21][22][23][24][25]. This approach has the advantage that it is not affected by fluorescent photobleaching.…”

Section: Application To Near-field Microscopymentioning

confidence: 99%

Optical theorem for nonlinear media

Schotland

2015

Phys. Rev. A

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“…However, theoretical analysis of the near-field effects in nonlinear optical spectroscopy in general and SHG in particular has been attracting interest for decades in relation to surface-enhanced nonlinear optical phenomena which occur in the near field of surface features (Moskovits 1985). The possibility of studying nonlinear optical processes with SNOM and their specifics have been theoretically suggested by Vigoureux et al . (1994) and Zhao & Kopelman (1995).…”

Section: Introductionmentioning

confidence: 99%

Near-field second-harmonic generation

Zayats

Smolyaninov

2004

Philosophical Transactions of the Royal Society of London. Seri

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Near-field microscopy of second-harmonic generation combines high surface sensitivity of the nonlinear optical process and high spatial resolution of the near-field optics. It enables investigation of nonlinear optical phenomena at the nanoscale and provides an opportunity to develop a highly sensitive optical technique for materials characterization. In this paper we overview apertured and apertureless near-field approaches for local studies of second-harmonic generation. Near-field second-harmonic generation at metal surfaces and nanostructures and related electromagnetic field enhancement and confinement effects are considered. The latter demonstrates the feasibility of achieving nanoscale light sources using second-harmonic generation. Applications of second-harmonic near-field microscopy for characterization of magnetic and ferroelectric materials are also discussed. Nonlinear nano-optics can lead to the development of novel photonic devices on the sub-wavelength-scale as well as new tools for imaging and local optical studies of materials, chemical and biological species.

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Nonlinear Near Field Optics

Cited by 22 publications

References 18 publications

Theoretical analysis of scanning near‐field optical microscopy

Theoretical analysis of scanning near‐field optical microscopy

Optical theorem for nonlinear media

Near-field second-harmonic generation

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