2011
DOI: 10.1016/j.ssc.2011.02.003
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Nonlocal analysis to study of the impact ionization and avalanche characteristics of deep submicron Si devices

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Cited by 8 publications
(3 citation statements)
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“…Structural developments have led to the fabrication of both Si and AlAsSb avalanche diodes with 100 nm channels 20,21 and smaller dimensions are expected. 22 These results, available in the literature of avalanche diode research, show that our InSb device can be scaled to sizes of 10 to 100 nm.…”
Section: Prospects For Scalingmentioning
confidence: 65%
“…Structural developments have led to the fabrication of both Si and AlAsSb avalanche diodes with 100 nm channels 20,21 and smaller dimensions are expected. 22 These results, available in the literature of avalanche diode research, show that our InSb device can be scaled to sizes of 10 to 100 nm.…”
Section: Prospects For Scalingmentioning
confidence: 65%
“…However, high internal gain mechanism of APDs eliminates the burden of trans-impedance amplifiers in case of the applications where SNR-budget is not a major concern. Moreover, high sensitivity and ultra-high speed of APD are the primary reasons behind the superiority of APDs over other photo-detectors [2][3][4][5][6]. The APD-based optical receivers can achieve high signal-to-noise ratio within smallest noise equivalent power among all state-of-the-art photo detectors [7].…”
Section: Introductionmentioning
confidence: 99%
“…Also, it has been shown that in ultra-thin APDs, those carriers that ionize early along their trajectories arrive at the ionization event with enhanced velocities given by [14,15] …”
Section: Introductionmentioning
confidence: 99%