Normal spectral emissivity measurement study of high-temperature alloy (316L) at 673–1273 K with a thermal oxidation surface

Wang, Yang; Dai, Jingmin; Zhang, Yufeng; Hua, Weizhuo

doi:10.1016/j.infrared.2024.105418

Infrared Physics & Technology

2024

DOI: 10.1016/j.infrared.2024.105418

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Normal spectral emissivity measurement study of high-temperature alloy (316L) at 673–1273 K with a thermal oxidation surface

Yang Wang,

Jingmin Dai,

Yufeng Zhang

et al.

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Cited by 1 publication

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High-Resolution Infrared Reflectance Distribution Measurement Under Variable Temperature Conditions

Yang,

Li,

Huang

et al. 2024

Sensors

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The bidirectional reflectance distribution function (BRDF) can effectively characterize the reflectance properties of a target, which can be used to correct infrared remote sensing data and improve the accuracy of remote sensing measurements. When the surface temperature changes, the reflectance characteristics of the target usually change, and it is necessary to carry out BRDF measurements under variable temperature conditions. In this paper, a variable-temperature infrared BRDF measurement system based on a robotic arm is developed to realize high-resolution wide-temperature region measurement of BRDF. To improve the measurement accuracy, the shaping optical path was used to expand the laser beam, combined with the laser level to accurately adjust the three-dimensional coordinates of the robotic arm, and the dichotomy method is used to calibrate the detector nonlinearly. A portable heater suitable for the mechanical arm corner mechanism is developed, and fast and high-precision temperature control is realized by proportional integral derivative (PID) control. The specular and diffuse BRDF distributions were measured at room temperature to verify the effectiveness of the system. The BRDF distribution of SUS314 stainless steel samples with different roughness is measured during two temperature increases from 20 °C to 1000 °C, and the changing rule of BRDF under variable temperature environment is summarized, which provides technical support for evaluating the optical properties of high-temperature materials and improving the measurement accuracy of remote sensing data.

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High-Resolution Infrared Reflectance Distribution Measurement Under Variable Temperature Conditions

Yang,

Li,

Huang

et al. 2024

Sensors

View full text Add to dashboard Cite

show abstract

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Normal spectral emissivity measurement study of high-temperature alloy (316L) at 673–1273 K with a thermal oxidation surface

Cited by 1 publication

References 14 publications

High-Resolution Infrared Reflectance Distribution Measurement Under Variable Temperature Conditions

High-Resolution Infrared Reflectance Distribution Measurement Under Variable Temperature Conditions

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