We investigate coherent phonon propagation in a thin film of ferroelectric PbZr0.2Ti0.8O3 (PZT) by ultrafast x-ray diffraction (UXRD) experiments, which are analyzed as time-resolved reciprocal space mapping (RSM) in order to observe the in-and out-of-plane structural dynamics simultaneously. The mosaic structure of the PZT leads to a coupling of the excited out-of-plane expansion to in-plane lattice dynamics on a picosecond timescale, which is not observed for out-of-plane compression.Oxides are attractive constituents of future nanoelectronic devices, because of their broad spectrum of outstanding physical properties, such as ferroelectricity and ferromagnetism, and owing to the progress made in the fabrication of high quality epitaxial heterostructures.[1] Epitaxial strain engineering and the careful choice of mechanical and electrical boundary conditions enable a direct influence on these functionalities.[2-6] Structural defects and nanoscale inhomogeneities, such as dislocations and domains, typically affect the properties of functional oxides and have been extensively studied by experiment and theory. [7,8] Ultrafast x-ray diffraction (UXRD) emerged as a powerful tool to observe lattice motion in real time [9][10][11] and has provided a deeper insight in the structure-property relations of functional oxides on ultrashort timescales. Recent femtosecond x-ray scattering experiments on ferroelectric oxides showed that electron screening induces an ultrafast piezoelectric response of the lattice [12] and that in turn the deformation leads to a change of the polarization.[13] However, these experiments were conducted on rather perfect epitaxial crystals. The influence of nano-domains has been considered in experiments on transient phases [14], but the role of static structural defects remained unexplored on such ultrafast timescale.Here we exemplify how ultrafast reciprocal space mapping (URSM) using a laser-based plasma x-ray source yields direct additional information on the reversible inplane structure dynamics in a ferroelectric perovskite PbZr 0.2 Ti 0.8 O 3 (PZT) film which is solely induced by the existence of dislocations typical of such materials. In particular, the width of the PZT Bragg reflection reports that tensile out of plane strain leads to drastically increased damping. The energy flows into in-plane strain which is evidenced by the in-plane component of the reciprocal space map. Our results indicate that in mismatched epitaxial films of oxide materials, with their high * daniel.schick@uni-potsdam.de • a-domains are embedded in the matrix of the c-axis grown tetragonal PZT film, as proved by the AFM topography image in b) as well. Misfit dislocations (MD) and threading dislocations (TD) formed at the SRO-PZT interface and across the PZT film, accounting for the lateral inhomogeneity on a sub-100 nm length scale.susceptibility to the formation of domains and dislocations, in-plane phenomena emerge on a hundred picosecond timescale. URSM yields the relevant information on lateral lattice dynamic...