Note: Parameter extraction of samples without the direct application of the passivity principle from reference-plane-invariant measurements

Abstract

An extraction algorithm has been proposed for explicit complex permittivity and complex permeability determination of samples using reference-plane-invariant scattering parameters without resorting to the application of the passivity principle. The algorithm relies on the definition of new odd and even reflection coefficients which result in no-crossing of the negative real axis for the argument of the square-root functions. Permittivity measurements of two low-loss samples were performed for validation of our algorithm.

Feasible Waveguide Method for Obtaining Electromagnetic Properties of Biaxial Bianisotropic Materials with Strong Magneto-Electric Coupling

“…Electromagnetic characterization of materials could be used in many applications areas such as medicine, food industry, and civil engineering since physical, chemical, and mechanical properties of these materials could be correlated to their electromagnetic parameters (Chen et al, 2004). There are many microwave methods available in the literature for electromagnetic characterization such as resonant-method (Jha & Akhtar, 2014), free-space method (Akhter & Akhtar, 2016), coaxial line method (Jablonskas et al, 2017), andwaveguide method (Damaskos et al, 1984;Baker-Jarvis et al, 1990;Akhtar et al, 2006;Chen et al, 2006;Allen et al, 2016;Hasar et al, 2017;Hasar & Ozturk, 2018;Xu, 2018). Considering the criteria of broadband measurements, repeatability in measurements, simplicity in measurements and easiness of sample preparation/machining, classical waveguide methods are extensively preferred measurement environment for electromagnetic parameter characterization of materials (Baker-Jarvis et al, 1990).…”

“…Considering the criteria of broadband measurements, repeatability in measurements, simplicity in measurements and easiness of sample preparation/machining, classical waveguide methods are extensively preferred measurement environment for electromagnetic parameter characterization of materials (Baker-Jarvis et al, 1990). Most of the waveguide methods proposed in the literature assume that the material under analysis is isotropic (Baker-Jarvis et al, 1990;Hasar et al, 2017;Hasar & Ozturk, 2018). For electromagnetic characterization of biaxial materials, the method proposed used in Damaskos et al (1984) could be applied.…”