Novel Core Test Wrapper Design Supporting Multi-mode Testing of NoC-based SoC

Zhang, Ying; Wu, Ning; Feng, Guorui; Chen, Xin; Zhou, Lei

doi:10.14257/ijca.2013.6.5.23

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Novel Core Test Wrapper Design Supporting Multi-mode Testing of NoC-based SoC

Abstract: According to embedded IP core structure and various DFT strategies, it

Cited by 5 publications

References 13 publications

A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip

A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip

The cost-effective fault detection and fault location approach for communication channels in NoC

Regional gradient observability for semilinear hyperbolic systems: HUM approach

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