This paper presents a novel thermal protection circuit for low dropout regulators (LDOs). To avoid thermal damage under high power conditions, the output current of LDOs varies with the sensed load temperature. Both the current delivery capability at a pre-set temperature and the limit slope of load current can be tuned to accommodate different load conditions and temperatures. The proposed design was fabricated with a 0.18 µm CMOS process with a chip area of 0.073 mm2. Chip measurement results show that the proposed design reduces charging time by 18% over the conventional thermal shutdown structure.