Proceedings of the 16th International Symposium on Power Semiconductor Devices &Amp;amp; IC's 2004
DOI: 10.1109/wct.2004.240148
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Novel high power semiconductor module for trench IGBTs

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Cited by 4 publications
(2 citation statements)
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“…The electrical resistivity is not affected by the presence of SF because they are formed and expanded only in a thin layer at the wafer surface. High energy X-ray investigation on the as-grown boule revealed a high quality single crystal without bending of the crystallographic planes pointing to a very low mosaicity in the whole crystal volume [8]. Growth along the [01-15] direction is considered to be very promising in order to achieve high quality SiC crystals.…”
Section: Silicon Carbide and Related Materials 2006mentioning
confidence: 99%
“…The electrical resistivity is not affected by the presence of SF because they are formed and expanded only in a thin layer at the wafer surface. High energy X-ray investigation on the as-grown boule revealed a high quality single crystal without bending of the crystallographic planes pointing to a very low mosaicity in the whole crystal volume [8]. Growth along the [01-15] direction is considered to be very promising in order to achieve high quality SiC crystals.…”
Section: Silicon Carbide and Related Materials 2006mentioning
confidence: 99%
“…One example is the SEMiX series that utilizes spring contacts for the IGBTs to eliminate the reliability problems associated with wire bonds [15]. One example is the SEMiX series that utilizes spring contacts for the IGBTs to eliminate the reliability problems associated with wire bonds [15].…”
Section: Intelligent Power Modulesmentioning
confidence: 99%