New results on bulk growth of 6H-SiC crystals along the [01-15] direction are presented.
The aim of our work is to improve the quality of the crystal grown by classical PVT method by
employing alternative growth directions, other than conventional [0001]. Using a specially designed
graphite crucible, crystals with an expansion angle of 30 degrees and diameters up to 40 mm have
been grown. No polycrystalline rim develops at the contact with the graphite wall. Concerning
specific defect content in the [01-15]-oriented crystals, they appear completely free of micropipes
and screw or threading edge ([0001]-oriented) dislocations. The [01-15] crystal relaxes adopting a
network of in-plane (0001) dislocations. They are not uniformly distributed reaching the maximum
density of about 106 cm-2.