2020
DOI: 10.1107/s2053273320004945
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Novel phasing method using the origin-free modulus sum function expressed in terms of the absolute electron density

Abstract: The origin-free modulus sum function S M refines the set Φ of phases of the structure factors by maximizing the coincidence between the experimental origin-free modulus function and the calculated one in terms of the ρ(Φ)2 density function [Rius, J. (1993). Acta Cryst. A49, 406–409]. Maximization is normally achieved through the recursive application of a Fourier-base… Show more

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Cited by 4 publications
(10 citation statements)
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“…The novel S M;jj phasing function is rooted in the Z R originfree modulus sum function, a nearly 30 years-old directmethods phasing function (Rius, 1993). Both mainly differ in (i) the introduction of 'Fourier transform' calculations instead of the complex manipulation of 'structure invariants' (Rius et al, 2007); (ii) the replacement of 2 ðrÞ by jðrÞj at each point r of the unit cell by using the property that 2 ðrÞ and jðrÞj are positive-definite functions with similar shape (Rius, 2020). The resulting S M;jj phase refinement function is defined by…”
Section: Introductionmentioning
confidence: 99%
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“…The novel S M;jj phasing function is rooted in the Z R originfree modulus sum function, a nearly 30 years-old directmethods phasing function (Rius, 1993). Both mainly differ in (i) the introduction of 'Fourier transform' calculations instead of the complex manipulation of 'structure invariants' (Rius et al, 2007); (ii) the replacement of 2 ðrÞ by jðrÞj at each point r of the unit cell by using the property that 2 ðrÞ and jðrÞj are positive-definite functions with similar shape (Rius, 2020). The resulting S M;jj phase refinement function is defined by…”
Section: Introductionmentioning
confidence: 99%
“…According to Rius (2020), the values of m are 1 (for > 0), 0 (for between 0 and Àt ) and À1 (for < Àt ) with 2 being the variance of (È) and t ' 2.5. Hereafter S M;jj will be shortened to S M for simplicity.…”
Section: Introductionmentioning
confidence: 99%
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“…Our research group has been devoted for a long time to the development of methodologies to obtain information from diffraction data. From the recent through-the-substrate methodology (tts-µXRD) [2] or the latest developments on the origin-free modulus sum function phasing method [3], to the well-established full pattern matching DAjust software [4], the Rietveld refinement program RIBOLS or the direct-space strategy TALP [5] to solve molecular structures from powder diffraction data. The data plotting capabilities never were a priority for us since there are plenty of available tools that can plot 1D and 2D XRD data as part of their data analysis capabilities, such as WinPLOTR [6], Fit2D [7], GSAS [8], EXPO [9], JPowder [10], Highscore [11] or TOPAS [12] among others.…”
Section: Introductionmentioning
confidence: 99%