“…89-2880, space group: F4(-)3m, a = 5.950 Å) can all be accurately indexed to the diffraction peaks located at 25.9, 29.9, 42.9, and 50.8°. 25 The XRD pattern shows no additional impurity peaks, indicating there is no phase Similarly, radially extended fanlike structures were also observed in the Ge thin films. 26 The uneven crystallite fanlike domains, whose sizes vary from 10 to 2 μm, are observed for the 90 nm thin films annealed at 200 °C for 20 min, as shown in Figure 2a.…”