2019
DOI: 10.3390/s19030579
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Novel Test Fixture for Characterizing MEMS Switch Microcontact Reliability and Performance

Abstract: In microelectromechanical systems (MEMS) switches, the microcontact is crucial in determining reliability and performance. In the past, actual MEMS devices and atomic force microscopes (AFM)/scanning probe microscopes (SPM)/nanoindentation-based test fixtures have been used to collect relevant microcontact data. In this work, we designed a unique microcontact support structure for improved post-mortem analysis. The effects of contact closure timing on various switching conditions (e.g., cold-switching and hot-… Show more

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Cited by 8 publications
(7 citation statements)
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“…In addition, a large F c helps to break contaminating films and enhances the stability of R c from cycle to cycle [35]. Experimental data suggest the minimum required value of 100 µN per contact [29][30][31]33,38].…”
Section: Methodsmentioning
confidence: 99%
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“…In addition, a large F c helps to break contaminating films and enhances the stability of R c from cycle to cycle [35]. Experimental data suggest the minimum required value of 100 µN per contact [29][30][31]33,38].…”
Section: Methodsmentioning
confidence: 99%
“…However, this assumption is valid for clean surfaces. For rea tacts, exceeding the threshold of 100 µN allows one to expect a more significant dec in Rc [29][30][31]33,38] and its stabilization due to the breaking of contaminating films restoring force grows from 18 to 59 µN and is approximately half of Fc, which ensu reliable overcoming of stiction. An additional benefit is the reduction in Vpull-in from 50 V. These results are achieved by reducing the bump height from 0.5 to 0.2 µm an gap from 1.5 to 0.6 µm as well as by increasing the cantilever thickness from 2.0 to 4.…”
Section: Choosing the Vertical Dimensionsmentioning
confidence: 99%
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“…Based on the stiffness and density of Ni (ρ Ni ), the resonance frequency (f resonance ) can be calculated. Resonance frequency determines the highest actuation frequency (f actuation ) [23,24]. Figure 4a shows beam resonance frequency variation.…”
Section: Beam Modeling For Microcontact Test Structurementioning
confidence: 99%
“…like the phase change material, transitional metal oxide, etc. [101][102][103][104][105]. For a good RF device, a low ON resistance (Ωs), a low OFF capacitance (fF), a low power consumption (µW-mW range), and a flat broad band response is required (up to 50 GHz).…”
Section: Design and Simulation Of Lc-cnt-based Rf Devicesmentioning
confidence: 99%