This chapter examines the background and practice of X-ray diffraction (XRD) and considers this phenomenon principally in the context of X-ray-based security screening. The focus will be upon the practical aspects of XRD as many texts already provide comprehensive descriptions of the relevant theoretical background and that of the closely associated area of crystallography. Xray diffraction and its development from simple materials identification to dynamic imaging will be considered, followed by a similar view of aviation screening. Subsequently, a new approach to the harvesting of diffraction signatures (Focal Construct Technology) will be introduced and consequent potential applications summarised.The text provides a starting point for those interested in developments that exploit X-ray diffraction, particularly in the security screening sector.
X-Ray DiffractionFollowing the discovery of X-rays in 1895 by Roentgen [1], their exploitation produced two, almost irreconcilable, distinct disciplines: imaging (radiography) and X-ray diffraction. Von Laue, after demonstrating the wave nature of the rays, showed that the intriguing scatter patterns could be thought of as arising from a three-dimensional diffraction grating. When single crystals were illuminated by a pencil beam of X-rays, they produced discrete spots (intensity maxima) in regular patterns remote from the beam path on a photographic film. Von Laue [2] developed a series of relationships to interpret these patterns and they remain a cornerstone of crystallography