Nucleation of the C40-to-C11 b transformation in magnetron-sputtered MoSi 2 thin films

Powder X-ray diffraction pattern of NbSi1.9 containing planar stacking faults

“…Inui and Yamaguchi [10] observed a partial dislocation of AeD, BeC and CeB in NbSi 2 by high-resolution transmission electron microscopy (HRTEM) after deformation of an NbSi 2 single crystal by compression tests. Wang et al [11] reported the planar stacking faults of ABCABA of the C40 structure for MoSi 2 thin film by HRTEM.…”