Nucleon induced recoil ions in microelectronics

Abstract

Abstract. Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.

Modern Nuclear Data Evaluation with the TALYS Code System

“…We realize that this is not always the case, and observed deviations up to a factor of 2 suggest the need for further improvements in nuclear models and their parameters. Finally, for recoil information, which are calculated by TALYS with a deterministic approach, we can compare them with the more exact Monte Carlo calculation of [110]. Again, results are usually comparable within a factor of 2.…”