2008
DOI: 10.1007/s11664-008-0438-z
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Numerical Analysis of a Very Long-Wavelength HgCdTe Pixel Array for Infrared Detection

Abstract: In this paper we present numerical simulations of pixel arrays for detection of very long-wavelength ( ‡14 lm) infrared radiation. The drift-diffusion equations are solved on a three-dimensional finite element grid; this approach avoids errors typically introduced by one-or two-dimensional simplifications which are difficult to quantify. We simulate the device structure and compare our numerical results with values measured on fabricated and characterized devices. The aim is to test the quality of the HgCdTe m… Show more

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Cited by 34 publications
(8 citation statements)
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“…In this case the pixel is similar to the one presented by D'Orsogna and coworker in Ref. 8. The upper panel of Fig.…”
Section: Looking Atsupporting
confidence: 69%
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“…In this case the pixel is similar to the one presented by D'Orsogna and coworker in Ref. 8. The upper panel of Fig.…”
Section: Looking Atsupporting
confidence: 69%
“…The same structure was also the object of the study presented in Ref. 8, in which the optical generation rate was determined using a standard exponential decay of the photon flux inside the device. In this work we have considered pixel arrays with and without CdZnTe substrate.…”
Section: Simulation Resultsmentioning
confidence: 99%
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“…As a result, the critical parameters characterizing electrical and optical properties can fluctuate with different fabrication processes, resulting in inaccuracies in predicting device properties. [8][9][10][11] Therefore, it is very important to obtain highly accurate characteristic parameters from specific, relatively stable fabrication processes for numerical modeling. However, it is difficult to extract the characteristics from measured currentvoltage (I-V) or resistance-voltage (R-V) curves using a commercial package, due to inaccuracies at small currents as well as the sensitivity of actual devices to uncontrolled and unknown variables.…”
Section: Introductionmentioning
confidence: 99%