2022
DOI: 10.21203/rs.3.rs-832025/v1
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Numerical Modelling of Carrier Transport in Organic Field Effect Transistors

Abstract: Organic field effect transistors (OFETs), used in the fabrication of nano-sensors, are one of the most promising devices in the field of organic electronics, because of their light weight, flexible and low fabrication cost. However, the optimization of such OFETs is still in an early stage due to the very limited analytical as well as numerical models presented in the literature. This research presses to demonstrate a numerical carrier transport model based on finite element method (FEM), to investigate the I-… Show more

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(4 citation statements)
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“…We attribute this to the capability of designing ultra‐low threshold voltage OFET, as previously reported in References 16–18. In addition, the previous investigation recorded a very acceptable and controllable on/off current ratio and subthreshold swing (SS) 19–22 . In such a context, selecting the primary active OSC material, the device dimension, and the doping level is the critical design parameters for the OFETs 23 .…”
Section: Introductionsupporting
confidence: 54%
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“…We attribute this to the capability of designing ultra‐low threshold voltage OFET, as previously reported in References 16–18. In addition, the previous investigation recorded a very acceptable and controllable on/off current ratio and subthreshold swing (SS) 19–22 . In such a context, selecting the primary active OSC material, the device dimension, and the doping level is the critical design parameters for the OFETs 23 .…”
Section: Introductionsupporting
confidence: 54%
“…In addition, the previous investigation recorded a very acceptable and controllable on/off current ratio and subthreshold swing (SS). [19][20][21][22] In such a context, selecting the primary active OSC material, the device dimension, and the doping level is the critical design parameters for the OFETs. 23 Moreover, the OFET architecture, based on the gate and the contact arrangement, can influence the overall device I-V transfer characteristics.…”
Section: Introductionmentioning
confidence: 99%
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