2018 International Semiconductor Conference (CAS) 2018
DOI: 10.1109/smicnd.2018.8539752
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Numerical Simulations of Radiation Damage Effects in Active-Edge Silicon Pixel Sensors for High-Energy Physics Experiments

Djemouai Djamai1,
E. Leonidas Gkougkousis2,
M. Chahdi3
et al.
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