1987
DOI: 10.1108/eb010032
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Numerical Solution of the Hydrodynamic Model for a One‐dimensional Semiconductor Device

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Cited by 65 publications
(23 citation statements)
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“…This represents that the new model can be applied to devices with larger size, i.e., where the QM effects are negligible. These results agree also very well with that previously reported in the literature [2,14,17,31].…”
Section: Numerical Examplessupporting
confidence: 95%
“…This represents that the new model can be applied to devices with larger size, i.e., where the QM effects are negligible. These results agree also very well with that previously reported in the literature [2,14,17,31].…”
Section: Numerical Examplessupporting
confidence: 95%
“…In the following, a number of simplifications will be illustrated which lead to the hydrodynamic model [1, 10,[12][13][14][15][16]. To begin with, it is possible to simplify the diffusive terms in (2.3.6) and (2.3.8); remembering the definition (2.2.6) of the random velocity Cn and observing that en = 0, one finds in fact UiU = CniCn +UiU and, similarly, EUiU = EUiCn +EUi U.…”
Section: The Convective Terms and Time Derivativesmentioning
confidence: 99%
“…The solution n t+l is used to update the quai-Fermi potential \|/", which is given by [25] ^+ 1^v i +1 -^ln(^). (5.43) e n a Then we put this quasi-Fermi potential into the Poisson equation to obtain the new potential and the new electron density at time level (t+1).…”
Section: The Numerical Methods For the Transient Problemmentioning
confidence: 99%
“…The Lei-Ting balance equations have been successfully applied to many types of semiconductor microstructures, including studies of nonequilibrium phonon, nonstationary and high frequency transport [22,23]. Unlike other hydrodynamic equation based approaches to device modeling, where the various relaxation rates are imported from Monte Carlo calculations or simply assumed to be constant [24,25,26], the Lei-Ting hydrodynamic balance equations approach includes scattering in the form of frictional force functions due to electron-impurity and electron-phonon interaction and an energy loss function due to electron-phonon interaction. These quantities are calculated within the simulation process itself, as functions of the electron drift velocity, electron temperature, as well as the electron density, without an outside, separate Monte Carlo procedure [21,27,28].…”
Section: Introductionmentioning
confidence: 99%