Numerical study of scattering from rough inhomogeneous films

Abstract

We adapt the differential method to the study of scattering from randomly rough inhomogeneous films, and we extend the application domain of the surface-integral method to rough surfaces with many embedded scatterers. These methods are compared in the case of geometries in which both volume and surface scattering occur. A good agreement is obtained, and the advantages and drawbacks of each technique are pointed out. The angular scattering from rough inhomogeneous structures corresponding to models of snowcover in the radio-frequency domain or paints in the optical domain is shown.

Radiative Transfer Theory for Layered Random Media

“…With the recent development of fast and efficient algorithms for scattering computations and the enormous increase in computer resources it is now feasible to take an entirely numerical approach to this problem without imposing any approximations. In spite of such developments, to keep the size of the problem manageable only special cases have been studied thus far (Giovannini et al, 1998;Peloci & Coccioli, 1997;Pak et al, 1993;Sarabandi et al, 1996). Hence it is very much of relevance, interest, and convenience to apply the RT approach to these problems.…”

Remarks on the Radiative Transfer Approach to Scattering of Electromagnetic Waves in Layered Random Media

“…With the recent development of fast and efficient algorithms for scattering computations and the enormous increase in computer resources it is now feasible to take an entirely numerical approach to this problem without imposing any approximations. In spite of such developments, to keep the size of the problem manageable only special cases have been studied thus far [11,25,22,26]. Hence it is very much of relevance, interest and convenience to apply the RT approach to these problems.…”

Full polarization optical profilometry

“…This operator has no explicit expression, even if the direct surface wave scattering problem can nowadays be solved without any physical assumption by numerical methods [11,15,16] such as the boundary integral equation method (BIE) [13] or the finite element method. The principle of the BIE is a good illustration of the implicitness of operator F. Following the BIE, the total field ψ l and its normal derivative ∂ n ψ l on the profile are the solutions of a boundary integral equation whose right-hand side is the incident field ψ inc l on the profile.…”

“…Different papers [3]4-6] have reported theoretical and experimental results showing that, in this case, the synthetic aperture obtained by varying the incidence angle can lead to a resolution twice better than that of conventional microscopes. Outside the domain of validity of first-order approximations, when multiple scattering occurs in the sample, a resolution beyond the Abbe-Rayleigh criterion can be reached [7][8][9][10][11]. In this case, an inversion procedure based on a rigorous model of diffraction is mandatory.…”