Observation of a high spin polarization of secondary electrons from single crystal Fe and Co

Kisker, E.; Gudat, W.; Schröder, K.

doi:10.1016/0038-1098(82)90561-0

Cited by 110 publications

(26 citation statements)

References 18 publications

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“…92 100 nm film of GaAs (110) in purpose built polarized electron source Measured using a 120 kV Mott polarimeter Mulhollan et al [293] À83 AE 5 Photoemission from Fe (110) on W(110) at E F P value refers back to Dedkov et al [194] and Kurazawa et al [88], which both then refer back to Raue et al [29] who used a 100 kV Mott polarimeter in which S eff was stated, without further detail, to be 0.16. Kurazawa data show quite a spread in values Dedkov et al [190] 35 AE 5 2 eV 2 y electrons from Co grown on Cu(001) P value refers back to Kisker et al [294] in which a classical Mott polarimeter operating at 100 kV was used Winkelmann et al [64] 8.2 AE 0.5 2 eV 2 y electrons from Ni (110) P value refers back to Hopster et al [295] in which a classical Mott polarimeter operating at 100 kV and estimated to be correct to 10 % was used Typical instrumental asymmetries for retarding-potential Mott polarimeters are around 10 %, though values much lower than this have been reported. Values quoted for exchange scattering polarimeters are similar though with extreme attention to detail values of 0.3 % [64] and even down to 0.03 % [20] have been reported.…”

Section: Instrumental Asymmetry and Its Eliminationmentioning

confidence: 96%

Spin-Resolved Valence Photoemission

Seddon

2014

Handbook of Spintronics

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Spin-resolved valence photoemission has recently seen a resurgence of interest fostered by exciting results in a range of interesting materials. Reviewed here are the basics of, the instrumentation for, and techniques useful in spin-resolved photoemission, together with illustrative examples of its utilization for materials of general importance and of particular relevance to spintronics applications. The example materials are broadly classified into nonmagnetic and magnetic systems. The former covers Rashba systems and topological insulators. The latter includes thin films, half-metals, adsorbates and induced moments, and, finally, a short section on imaging. The review is not intended to be comprehensive in its coverage but rather to provide an introduction to hardware and techniques together with an overview of selected results and state-of-the-art developments. List of Abbreviations 1DOne

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Section: Instrumental Asymmetry and Its Eliminationmentioning

confidence: 96%

Spin-Resolved Valence Photoemission

Seddon

2014

Handbook of Spintronics

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“…7.2. Energy resolved spin polarizations have been measured for Fe, Co, Ni, and also alloys [38][39][40]. In all cases there is a strong spin polarization enhancement at very low energies.…”

Section: Basics: Secondary Electron Emissionmentioning

confidence: 97%

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Oepen¹,

Hopster²

2005

NanoScience and Technology

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Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields. IntroductionIn 1982, triggered by the investigations of the energy dependence of the spinpolarization of secondary electrons (SE), the idea emerged to use this effect in a microscope to image magnetic structures [1,2]. The combination of a conventional Scanning Electron Microscope (SEM) and a spin-polarization analyzer promised the potential of investigating magnetic microstructures with high spatial resolution. In 1984, the first spin-SEM was realized by Koike and coworkers [3], followed less than one year later by a microscope built at NIST [4]. The latter group introduced the abbreviation SEMPA, which stands for Scanning Electron Microscope with Polarization Analysis. We will use both acronyms interchangeably. The next instruments followed in Europe [5,6]. A sketch of SEMPA is given in Fig. 7.1. Due to the low depth of information, ultra-clean surfaces are essential, requiring ultrahigh vacuum (UHV) conditions. Since conventional SEMs usually do not operate in UHV, appropriate UHV-compatible columns (or guns) are rare and expensive. Hooked on is the detector system that consists of an electron optic and a spin-polarization analyzer. The optic has to focus the secondaries into the polarization analyzer. The most important feature of the electron optic is the acceptance angle for SE. It is extremely important that the optic collects electrons emitted in the full 2π solid angle.Several microscopes have been realized [7][8][9][10][11][12][13][14], and a few more have been proposed. Basically, all the systems look very similar. Some have attachments for surface

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“…7,8 The other is that the spin polarization increases with primary energy and reaches a saturation value at high primary energies. 6,9 The former characteristic has been explained qualitatively by Kisker et al 3 and by Hopster et al 6 However, there are few quantitative explanations given so far on the energy distribution of spin-polarized secondary electrons and, especially, on the fine structures at higher energies. Also, the primary energy dependence of spin polarization has not been explained yet.…”

Section: Introductionmentioning

confidence: 95%

“…2 A fundamental understanding of the polarization property is vital for these applications. Many experiments have been carried out to study the properties of spin polarization of secondary electrons for several types of magnetic materials such as single crystals, 3 metallic glasses 4,5 and polycrystalline permalloys. 3,6 Two major characteristics for the spin polarization of secondary electrons were found and regarded as very important.…”

Section: Introductionmentioning

confidence: 99%

“…Many experiments have been carried out to study the properties of spin polarization of secondary electrons for several types of magnetic materials such as single crystals, 3 metallic glasses 4,5 and polycrystalline permalloys. 3,6 Two major characteristics for the spin polarization of secondary electrons were found and regarded as very important. One is that the spin polarization of secondary electrons is much larger than the average conduction band polarization at low energies and it decreases with increasing kinetic energy of electrons.…”

Section: Introductionmentioning

confidence: 99%

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Analysis of the spin polarization of secondary electrons emitted from ferromagnetic materials

Sun

Ding

Yamauchi

2006

Surface & Interface Analysis

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A Monte Carlo model has been developed to study the spin polarization of secondary electrons emitted from magnetic materials. The spin direction of the generated secondary electrons is considered, and the spin-dependent inelastic mean free paths for spin-up and spin-down electrons are introduced to trace the secondary electrons in the simulation. Good agreement with respect to the energy distribution, including the enhancement at low energy and fine structure at higher energies in the secondary electron energy regime, can be found between the simulated polarization and the experimental data. The simulated primary energy dependence of the spin polarization is also found to agree reasonably well with the experimental data.

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Observation of a high spin polarization of secondary electrons from single crystal Fe and Co

Cited by 110 publications

References 18 publications

Spin-Resolved Valence Photoemission

Spin-Resolved Valence Photoemission

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Analysis of the spin polarization of secondary electrons emitted from ferromagnetic materials

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