In polycrystalline piezoelectric ceramics, ferroelectric domain texture is the most important parameter influencing the attainable electromechanical performance. High piezoelectric properties are obtained when the maximum poling of the material is achieved. This condition can be favoured by modifying material composition, poling routes or by proper grain texturing. Hence, it is necessary to characterise domain texture, in order to develop piezoceramics with improved performance. In this review, an outline of the methods for ferroelectric domain texture determination will be given, with focus on microscopic techniques. The advantages and complementarity of methods like X-ray and neutron diffraction, electron diffraction, and Raman spectroscopy will be highlighted.