1988
DOI: 10.1107/s0108767388001254
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Observation of Pendellösung fringes induced by X-ray resonant scattering

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Cited by 5 publications
(2 citation statements)
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“…With x-rays from a tunable synchrotron radiation source, it is possible to select the ratio of F hr and F hi , and make |F hr | |F hi |, or even F hr = 0, near the absorption edge of a component atom in the crystal [4][5][6][7][8][9][10][11][12][13][14][15]. In 1995, Fukamachi et al found that the shape of the dispersion surface is strongly related to the ratio of F hr and F hi [13].…”
Section: Introductionmentioning
confidence: 99%
“…With x-rays from a tunable synchrotron radiation source, it is possible to select the ratio of F hr and F hi , and make |F hr | |F hi |, or even F hr = 0, near the absorption edge of a component atom in the crystal [4][5][6][7][8][9][10][11][12][13][14][15]. In 1995, Fukamachi et al found that the shape of the dispersion surface is strongly related to the ratio of F hr and F hi [13].…”
Section: Introductionmentioning
confidence: 99%
“…The slowly varying modulation of the calculated IRP about 5 eV below the edge is the Pendelliisung fringe induced by X-ray resonant scattering (Yoshizawa, Fukamachi, Ehara, Kawamura & Hayakawa, 1988;Fukamachi, Yoshizawa, Ehara, Kawamura & Nakajima, 1990). …”
Section: Theoretical Basismentioning
confidence: 99%