“…For example, serial sectioning cannot be directly applied to this problem because the sample is destroyed during analysis [1,21,22] and transmission electron microscopy can only visualize the structure within very thin, nearly two-dimensional, samples. However, the recent development of near-field high-energy X-ray diffraction microscopy (nf-HEDM) [23][24][25][26][27][28] and X-ray diffraction contrast tomography [29,30] enables non-destructive measurements of the shapes and orientations of grains within a bulk sample at sequential stages during annealing.…”