2012
DOI: 10.1016/j.actamat.2012.04.020
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Observation of recovery and recrystallization in high-purity aluminum measured with forward modeling analysis of high-energy diffraction microscopy

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Cited by 77 publications
(69 citation statements)
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“…The three annealing times were 23 min, 30 min, and 25 min. Details of the nf-HEDM experiment and data analysis are given elsewhere [23][24][25][26][27][28].…”
Section: Methodsmentioning
confidence: 99%
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“…The three annealing times were 23 min, 30 min, and 25 min. Details of the nf-HEDM experiment and data analysis are given elsewhere [23][24][25][26][27][28].…”
Section: Methodsmentioning
confidence: 99%
“…For example, serial sectioning cannot be directly applied to this problem because the sample is destroyed during analysis [1,21,22] and transmission electron microscopy can only visualize the structure within very thin, nearly two-dimensional, samples. However, the recent development of near-field high-energy X-ray diffraction microscopy (nf-HEDM) [23][24][25][26][27][28] and X-ray diffraction contrast tomography [29,30] enables non-destructive measurements of the shapes and orientations of grains within a bulk sample at sequential stages during annealing.…”
Section: Introductionmentioning
confidence: 99%
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“…As the technique is nondestructive it enables studies of the same set of bulk grains before and after some external stimuli, e.g. elastic [5][6][7] and plastic deformation [8][9][10][11] or thermal annealing [12][13][14]. Several experimental set-ups are possible, each with specific advantages, e.g.…”
Section: Introductionmentioning
confidence: 99%
“…The experimental geometry implemented at the APS 1-ID beamline for near-field HEDM [41,42] was originated by Poulsen [43]. Combined with forward modeling reconstructions [41,44], the technique yields 3-D maps of crystallographic-orientation variations within and between grains in both ordered [45] and defected [46][47][48] materials. For a given cross-section of the specimen illuminated by the line-focused (approximately 0.004 Â 1.3 mm 2 ) monochromatic (50 keV) X-ray beam, diffraction spots from grains satisfying the Bragg condition were imaged as the sample rotated through 180°about the z axis, with images collected over 1°integration intervals; this procedure was repeated at two rotation-axis-to-detector positions.…”
Section: 22mentioning
confidence: 99%