2001
DOI: 10.1103/physrevlett.86.532
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Observation of Unequal Activation Volumes of Wall-Motion and Nucleation Processes inCo/PdMultilayers

Abstract: We report the difference in activation volumes of wall-motion and nucleation processes in Co/Pd multilayers. Each activation volume was estimated from field dependence of wall-motion speed and nucleation rate, obtained by real-time domain imaging using a magneto-optical Kerr effect microscope. Delicate analysis shows that the two activation volumes are generally unequal and the ratio between the volumes varies noticeably from 0.9 to 1.1 with change of the multilayered structure. We found that the inequality in… Show more

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Cited by 50 publications
(35 citation statements)
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“…When an applied field is lower than the coercivity field, magnetization reversal takes place by thermal activation of both nucleation and domain wall-motion processes. An exponential behavior occurs in this regime [1,2]. When an applied field is larger than the coercivity field, magnetization reversal is mainly carried out by viscous domain-wall motion, where the domain wall velocity varies linearly with an applied field [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…When an applied field is lower than the coercivity field, magnetization reversal takes place by thermal activation of both nucleation and domain wall-motion processes. An exponential behavior occurs in this regime [1,2]. When an applied field is larger than the coercivity field, magnetization reversal is mainly carried out by viscous domain-wall motion, where the domain wall velocity varies linearly with an applied field [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…As seen in figure 4, τ exponentially decreases with increasing H , for thick films with t Fe = 50 and 60 nm. Such a phenomenon can be explained by a thermally activated DW creep mechanism [27][28][29][30][31]. When the DW creep mechanism is dominant, τ is given by the following:…”
Section: Resultsmentioning
confidence: 99%
“…The relation between D f and log (V/R) can be expressed as D f ~ (E W -E N ) + C, where C is a constant related with Barkhausen volume or minimum size of activated domain [15]. With this assumption, the increased number of defects can be considered to make the E N lower and the E W higher, since the defect can be an initial site for domain nucleation as well as a damping barrier for wall propagation.…”
Section: Discussionmentioning
confidence: 99%