Observation of vacancies in the field-ion microscope

Speicher, Christoph; Pimbley, W. T.; Attardo, M. J.; Galligan, J. M.; Brenner, S.S.

doi:10.1016/0031-9163(66)90860-2

Cited by 20 publications

(6 citation statements)

References 3 publications

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“…Fig. (7) shows a series of subset of the reconstructed volume from the dataset introduced in Fig. (6).…”

Section: Fps (011) Poles Are Identify By Yellow Crosses (A) Cropped I...mentioning

confidence: 99%

“…The ability to localize precisely the 3-D coordinates of individual atoms in direct space is expected to find important applications in materials science. For instance, early atomicscale investigations of structural defects, such as vacancies and dislocations in metals [7][8][9][10], were enabled by FIM. The reconstruction of 3-D distribution of single vacancies caused by ion irradiation in W by FIM was the first of its kind [11,12].…”

Section: Introductionmentioning

confidence: 99%

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A model to predict image formation in the three-dimensional field ion microscope

Klaes

Lardé

Delaroche

et al. 2021

Computer Physics Communications

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This article presents a numerical model dedicated to the simulation of field ion microscopy (FIM). FIM was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of the atoms from the surface, the bulk of the material exposed, and, through a digitally processing a sequence of micrographs, a three-dimensional reconstruction can be achieved. 3DFIM is particularly suited to the direct observation of crystalline defects such as vacancies, interstitials, vacancy clusters, dislocations, and any combinations of theses defects that underpin the physical properties of materials. This makes 3DFIM extremely valuable for many material science and engineering applications, and further developing this technique is becoming crucial. The proposed model enables the simulation of imaging artefacts that are induced by non-regular field evaporation and by the impact of the perturbation of the electric field distribution of the distorted distribution of atoms close to defects. The model combines the meshless algorithm for field evaporation proposed by Rolland et al. (Robin-Rolland Model, or RRM) with fundamental aspects of the field ionization process of the gas image involved in FIM.

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“…Fig. (7) shows a series of subset of the reconstructed volume from the dataset introduced in Fig. (6).…”

Section: Fps (011) Poles Are Identify By Yellow Crosses (A) Cropped I...mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A model to predict image formation in the three-dimensional field ion microscope

Klaes

Lardé

Delaroche

et al. 2021

Computer Physics Communications

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show abstract

“…Through field ionization of an imaging gas near the sharp needle specimen's surface, FIM provides an atomically-resolved projection of the surface with near 100% imaging efficiency. FIM gives critical information regarding crystallographic defects such as vacancies [6,7,8,9], dislocations [10,11,12], or grain boundaries [12,13]. However, the nature of the contrast in FIM is still a matter of debate [14], making single atomic-scale studies of solute-defect interactions challenging.…”

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confidence: 99%

Revealing atomic-scale vacancy-solute interaction in nickel

et al. 2021

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“…Recent efforts in electron microscopy have proposed complex solutions to atomic-scale tomographic imaging of materials (Li et al, 2008; Azubel et al, 2014; Xu et al, 2015). Field ion microscopy (FIM) was the first microscopy technique to image individual atoms (Müller & Bahadur, 1956), lattice defects in metals including single vacancies (Speicher et al, 1966) and interstitials and extended dislocations (Fortes et al, 1968; Smith et al, 1968). In contrast to other high-resolution microscopy techniques, FIM relies on the ionization of inert gas atoms from prominent positions on the specimen surface, exploiting an intense electric field.…”

Section: Introductionmentioning

confidence: 99%

Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

et al. 2017

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An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen's surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM's potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of "out of sequence" events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.

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Observation of vacancies in the field-ion microscope

Cited by 20 publications

References 3 publications

A model to predict image formation in the three-dimensional field ion microscope

A model to predict image formation in the three-dimensional field ion microscope

Revealing atomic-scale vacancy-solute interaction in nickel

Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

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