2011
DOI: 10.1016/j.ijhydene.2011.02.130
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Occurrence of power overshoot for two-chambered MFC at nearly steady-state operation

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Cited by 24 publications
(16 citation statements)
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“…The slope of V-I curve estimates the internal resistance (R in ) of the MFC of 212 U. No cell power shoot proposed by Nien et al [21] and Liu et al [22] was noted for the present MFC. When temperature of MFC A was reduced from 25 to 15 C, the corresponding OCV and I scc were slightly reduced ( Fig.…”
Section: 2mentioning
confidence: 55%
“…The slope of V-I curve estimates the internal resistance (R in ) of the MFC of 212 U. No cell power shoot proposed by Nien et al [21] and Liu et al [22] was noted for the present MFC. When temperature of MFC A was reduced from 25 to 15 C, the corresponding OCV and I scc were slightly reduced ( Fig.…”
Section: 2mentioning
confidence: 55%
“…The DNA of the strain was isolated following the procedure of Ref. [21]; the strain was identified by 16S rDNA sequencing using 11F (5 0 -GTT TGA TCM TGG CTC AG-3 0 ) and 1512R (5 0 -ACG GCT ACC TTG TTA CGA CT-3 0 ). The DNA was amplified using an eppendorf mastercycler (Eppendorf AG, Hamburg, Germany) by denaturation at 94 C for 3 min with 35 cycles of 94 C for 30 s, 54 C for 60 s, 72 C for 90 s, and a final extension at 72 C for 7 min.…”
Section: Inoculum and Mfcmentioning
confidence: 99%
“…Current density was normalized by the projected surface areas of anodic sides. Polarization curves were measured by applying a linear potential decrease of 1 mV s À1 from the open circuit voltage to 0 mV [21,22]. Coulombic efficiency was calculated by dividing coulomb output (integrating current and time) by total coulomb input (based on sulfide or acetate) according to previous literature.…”
Section: Electrochemical Analysismentioning
confidence: 99%
“…However, during discharge tests in MFCs, an unexpected phenomenon referred to as “power overshoot” commonly occurs . Theoretically, the voltage and power (or power density) curves should vary directly with the current (or current density) during a discharge test .…”
Section: Introductionmentioning
confidence: 99%
“…The power overshoot is defined as a “doubling back” of the voltage and power curves toward lower currents, rather than increasing to the expected higher current . In other words, MFC performance tends to deteriorate after reaching the peak current . The power overshoot is therefore regarded as an obstacle to MFC development because it can complicate the interpretation of an MFC′s performance after reaching peak power loads.…”
Section: Introductionmentioning
confidence: 99%