Off-device fault tolerance for digital imaging devices

One of the most recent and exciting applications for CMOS image sensors is in the biomedical field. In such applications, these sensors often operate in harsh environments (high intensity, high pressure, long time exposure), which increase the probability for the occurrence of hot pixel defects over their lifetime. This paper presents a novel smart CMOS image sensor integrating hot pixel correcting readout circuit to preserve the quality of the captured images. With this approach, no extra non-volatile memory is required in the sensor device to store the locations of the hot pixels. In addition, the reliability of the sensor is ensured by maintaining a realtime detection of hot pixels during image capture.

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A Smart CMOS Image Sensor with On-chip Hot Pixel Correcting Readout Circuit for Biomedical Applications

Cao

Tang

Bermak

et al. 2010

2010 Fifth IEEE International Symposium on Electronic Design, Test &Amp; Applications

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Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies

Haye

Jung

Chen

et al. 2006

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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Off-device fault tolerance for digital imaging devices

Cited by 2 publications

References 20 publications

A Smart CMOS Image Sensor with On-chip Hot Pixel Correcting Readout Circuit for Biomedical Applications

A Smart CMOS Image Sensor with On-chip Hot Pixel Correcting Readout Circuit for Biomedical Applications

Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies

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