Multiscale Modeling in Epitaxial Growth
DOI: 10.1007/3-7643-7343-1_4
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Off-lattice Kinetic Monte Carlo Simulations of Strained Heteroepitaxial Growth

Abstract: Abstract. An off-lattice, continuous space Kinetic Monte Carlo (KMC) algorithm is discussed and applied in the investigation of strained heteroepitaxial crystal growth. As a starting point, we study a simplifying (1+1)-dimensional situation with inter-atomic interactions given by simple pair-potentials. The model exhibits the appearance of strain-induced misfit dislocations at a characteristic film thickness. In our KMC simulations we observe a power law dependence of this critical thickness on the lattice mis… Show more

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Cited by 12 publications
(9 citation statements)
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“…2. Due to the Ehrlich-Schwoebel effect the diffusing particles on top of islands tend to form mounds instead of growing layer by layer [12,13]. At the critical adsorbate height the lateral distance between two neighboring mounds is not large enough to allow an additional particle between the mounds, as shown in the case (2).…”
mentioning
confidence: 88%
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“…2. Due to the Ehrlich-Schwoebel effect the diffusing particles on top of islands tend to form mounds instead of growing layer by layer [12,13]. At the critical adsorbate height the lateral distance between two neighboring mounds is not large enough to allow an additional particle between the mounds, as shown in the case (2).…”
mentioning
confidence: 88%
“…2. The number of dislocations increases with the misfit and the mean distance between dislocations is close to 1/ which reflects the relative periodicity of the substrate and adsorbate lattice [13].…”
mentioning
confidence: 96%
“…A simulation [15] of this process of strain-driven change in surface morphology with increasing deposition thickness is shown in Figure 26.1. The availability of RHEED in the MBE environment provides a convenient way to monitor the evolution of the 2D to 3D transition in-situ.…”
Section: The Stranski-krastanov Transitionmentioning
confidence: 99%
“…The lattice mismatch of 2.5% between GaN and AlN is a smaller value than that for InAs/GaAs, and the first report on the growth of GaN QDs used antisurfactant epitaxy [110]. Because this generally has deleterious consequences for optical devices, there has been a study of nitride QDs in other nonpolar crystal directions [113][114][115][116] along the (10-10) and (11)(12)(13)(14)(15)(16)(17)(18)(19)(20) planes, and also various semipolar planes [117,118]. Although there is much less work available than on InAs/GaAs or Si/Ge, the III-nitride material combinations offer a fascinating playground for the study of selfassembled island growth due to some of their unique properties.…”
Section: Iii-nitridesmentioning
confidence: 99%
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