Summary
This paper presents a fast background calibration method for comparator offsets in pipeline ADCs and analyzes the practical considerations in a 1.8 V 0.18 μm 100Msps pipeline ADC with 15‐bit resolution (74 dB‐Signal‐to‐noise plus Distortion Ratio [SNDR]). A self‐repairing (SR) thermometer‐to‐binary encoder is developed to deal with malfunctioning in presence of high comparator offsets greater than one‐half least‐significant bit (LSB). In this situation, the effective thresholds between two adjacent comparators could be inverted leading to a faulty behavior with conventional architectures. The proposed solution allows a dynamic assignment of the calibration code associated to each comparator improving convergence speed. As demonstrator, its application to a 15‐bit pipeline ADC using a novel calibrated dynamic‐latch comparator (DLC) with internal threshold reference generation and no preamplifier is presented, showing a reduction on the total power consumption of 22% with respect to a design without calibration targeting the same specifications.