2006 IEEE 4th World Conference on Photovoltaic Energy Conference 2006
DOI: 10.1109/wcpec.2006.279378
|View full text |Cite
|
Sign up to set email alerts
|

OMVPE Grown InAs Quantum Dots for Application in Nanostructured Photovoltaics

Abstract: We have grown InAs QDs on two types of vicinal GaAs substrates and under various growth conditions. QDs grown on 2° offcut substrates show superior optical characteristics compared to QDs on 6° offcut substrates, which showed no QD luminescence. The InAs growth temperature was shown to have an impact on QD nucleation, with higher growth temperature leading to both improved dot densities and coherence. Finally, the V/III ratio during InAs growth dramatically effects the uniformity of the QD luminescence. Our be… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
7
0
2

Year Published

2008
2008
2016
2016

Publication Types

Select...
5
3
1

Relationship

3
6

Authors

Journals

citations
Cited by 21 publications
(10 citation statements)
references
References 9 publications
1
7
0
2
Order By: Relevance
“…Details of the cell design and InAs QD growth parameters have been reported previously. 13 InAs QDs are formed using the StranskiKrastanov technique which takes advantage of the 7.8% compressive strain between InAs and GaAs substrate.…”
Section: Methodsmentioning
confidence: 99%
“…Details of the cell design and InAs QD growth parameters have been reported previously. 13 InAs QDs are formed using the StranskiKrastanov technique which takes advantage of the 7.8% compressive strain between InAs and GaAs substrate.…”
Section: Methodsmentioning
confidence: 99%
“…The structure of the single junction is shown in Figure 1. Details of the growth of the baseline and strain compensated QD solar cells have been described previously [6], [7], [8]. No anti-reflection coating (ARC) is deposited to minimize the number of variables for external quantum efficiency (EQE) measurements.…”
Section: Device Fabricationmentioning
confidence: 99%
“…Substrates consisted of 350 !Jm thick GaAs oriented at 2° off the [100] direction toward the [110]. Growth conditions and optical properties of the OD have been reported previously [19]. A representative atomic force microscope (AFM) image of the optimal InAs dots is shown in Figure 2.…”
Section: Methodsmentioning
confidence: 91%