On application of output masking to undetectable faults in synchronous sequential circuits with Design-For-Testability logic

Pomeranz, Irith; Reddy, Sundara

doi:10.1109/iccad.2003.159777

Cited by 8 publications

(2 citation statements)

References 16 publications

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“…It is also possible to address overtesting by avoiding the detection of functionally undetectable faults [10, 11]. However, identifying all such faults has a high computational complexity.…”

Section: Introductionmentioning

confidence: 99%

Metric for the ability of functional capture cycles to ensure functional operation conditions

Pomeranz

2017

IET Computers & Digital Techniques

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Several test generation procedures are based on the expectation that after clocking a circuit in functional mode for several clock cycles, the circuit enters its functional state space and operates under functional operation conditions. Functional operation conditions are important for avoiding overtesting of delay faults. This study develops a quantitative metric for assessing the ability of functional capture cycles to take the circuit into its functional state space, and ensure functional operation conditions. The metric is based on the distances between the states that the circuit traverses during functional capture cycles and reachable states that the circuit can enter during functional operation. The paper also describes a procedure for modifying a test set so as to reduce the values of the metric for its tests.

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Section: Introductionmentioning

confidence: 99%

Metric for the ability of functional capture cycles to ensure functional operation conditions

Pomeranz

2017

IET Computers & Digital Techniques

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“…The procedure of [6] is accurate only about classifying a state as unreachable and may thus include non-functional broadside tests for some transition faults. The procedures of [7] and [8] attempt to avoid overtesting by avoiding the detection of undetectable faults. In [7], states necessary for the detection of undetectable faults are avoided.…”

Section: Introductionmentioning

confidence: 99%

Functional Broadside Tests with Different Levels of Reachability

Pomeranz

Reddy

2007

20th International Conference on VLSI Design Held Jointly With 6th International Conference on Embedded Systems (VLSID'07)

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Functional broadside tests for transition faults are broadside tests that detect transition faults using only states that the circuit can visit during functional operation, or reachable states. Reachability was used before as a binary property, i.e., a state is either reachable or not. We extend this concept to associate a level of reachability with every state. A non-zero level is associated with a reachable state. A reachable state that is more likely to occur during functional operation is associated with a higher reachability level than a state that is less likely to occur. Tests based on states with high levels of reachability and tests based on states with low levels of reachability can serve different purposes, and both may be needed for a high-quality test set. We describe a process of constructing a test set for transition faults such that each detectable fault would be detected by two functional broadside tests with the most extreme possible levels of reachability.

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