On-Chip Condition Monitoring of GaN Power Devices Using TJ-Independent TON Precursor for Device Aging and Gate Leakage IGSS for Dielectric Failure

Du, Lixiong; Huang, Yuanqing; Brian, D.

doi:10.1109/ispsd49238.2022.9813679

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On-Chip Condition Monitoring of GaN Power Devices Using T_J-Independent T_ON Precursor for Device Aging and Gate Leakage I_GSS for Dielectric Failure

Cited by 3 publications

References 9 publications

In Situ Detection of GaN $C_{\text{oss}}$ Changes Due to Aging for Device State-of-Health Determination in DC–DC Converters

In Situ Detection of GaN $C_{\text{oss}}$ Changes Due to Aging for Device State-of-Health Determination in DC–DC Converters

On-Chip Concurrent Device Aging Prognosis and Dielectric Failure Detection for GaN Power Devices

Chip-Level Condition Monitoring on Wide Bandgap Power Devices: Challenges & Opportunities

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