2011 14th Euromicro Conference on Digital System Design 2011
DOI: 10.1109/dsd.2011.84
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On-chip Monitoring: A Light-Weight Interconnection Network Approach

Abstract: Current nanometer technologies are subjected to several adverse effects that seriously impact the yield and performance of integrated circuits. Such is the case of within-die parameters uncertainties, varying workload conditions, aging, temperature, etc. Monitoring, calibration and dynamic adaptation have appeared as promising solutions to these issues and many kinds of monitors have been presented recently. In this scenario, where systems with hundreds of monitors of different types have been proposed, the ne… Show more

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